簡要描述:預(yu)冷(leng)預(yu)熱沖擊試(shi)(shi)(shi)驗(yan)箱(xiang)改設備是主要做(zuo)沖擊試(shi)(shi)(shi)驗(yan)的,就是一(yi)個箱(xiang)子里(li)面有(you)兩個區域,一(yi)個給預(yu)冷(leng)一(yi)個給預(yu)熱,等到測試(shi)(shi)(shi)得時間(jian)就把(ba)預(yu)冷(leng)好溫度(du)或預(yu)熱區的溫度(du)放(fang)出來,他(ta)的是功(gong)能高溫轉至低溫之間(jian)可以在(zai)很快時間(jian)內沖擊完成(cheng)試(shi)(shi)(shi)驗(yan)。
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品牌 | 愛佩科技/A-PKJ | 價格區間 | 5萬-10萬 |
---|---|---|---|
產地類別 | 國產 | 應用領域 | 醫療衛生,環保,石油,建材,電子 |
預冷預熱沖擊試驗箱目前適用的行業及產品有光電、LED、顯示器、顯示屏連接器,PCB連接器,FPC,電感器,電子元器件,數碼產品,太陽能組件,光伏組件,光纖,LCD,PCB,FPC,微電子,電機,汽車燈產品及零部件等大型產品或者大型零部件。從很低到很高的溫度包括中間的任意溫度均可隨意設定恒溫或者沖擊試驗。
制冷(leng)低溫(wen)區 | 溫(wen)度暴露范(fan)圍 | 0℃/-65℃ | ||
預熱溫度下限 | -75℃ | |||
溫度波(bo)動范圍 | ≤±0.5℃ | |||
溫(wen)度(du)降溫(wen)時間(jian) | -75℃≤60min | |||
加(jia)熱高溫(wen)區 | 溫度暴露范圍(wei) | 60℃~150℃ | ||
預(yu)熱溫度(du)上限 | 200℃ | |||
溫度波動范圍 | ≤±0.5℃ | |||
溫度上升(sheng)時間 | 室溫200℃≥45min | |||
性能指(zhi)標(biao) | 溫度測試范圍可選(xuan) | A:-40℃~150℃ B:-40℃~150℃C:-65℃~150℃ | ||
溫度均勻動 | 高溫室及低溫室均(jun)≤±2℃ | |||
樣品區承重 | 30kg | 30kg | 30kg | |
溫度運行控(kong)制系統 | 主要控制(zhi)器 | //中國臺灣(wan)(可選擇)進口LED數(shu)顯(P、I、D +S、S、R.)微電腦(nao)集(ji)成控制器 | ||
精度(du)范(fan)圍 | 設(she)定浮(fu)動度:溫度±0.2℃,指示精度:溫度±0.1℃,分(fen)辨率:0.01℃ | |||
制冷系統(tong) | 進口半封(feng)閉水(shui)冷式壓縮機組或原裝“泰康”/全(quan)封閉風冷壓縮(suo)制冷機組 | |||
循環系統 | 耐溫低噪音空(kong)調型電機.多葉式離心風輪(lun) | |||
溫(wen)度轉換時(shi)間 | 從制冷(leng)低溫(wen)區到加熱高溫區或從加熱高溫區到制冷低溫區≤10S | |||
溫度恢復時間 | ≤5min(冷熱(re)溫度(du)沖擊機(ji)|高(gao)低(di)溫溫度(du)沖擊試驗機(ji)的恢復(fu)時間與暴露溫(wen)差、冷卻水(shui)溫(wen)、恒溫(wen)時(shi)間、樣品重量有關) |
預冷預熱沖擊試驗箱本設備滿足:GB/T2423.1-2008 電(dian)(dian)(dian)(dian)(dian)工(gong)電(dian)(dian)(dian)(dian)(dian)子產(chan)品(pin)環境試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan) 第2部分(fen)試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)方法 試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)A 低溫(wen);GB/T 2423.2-2008 電(dian)(dian)(dian)(dian)(dian)工(gong)電(dian)(dian)(dian)(dian)(dian)子產(chan)品(pin)環境試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan) 第2部分(fen):試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)方法 試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)B:高(gao)溫(wen);GB/T 10589-2008 低溫(wen)試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱技(ji)術(shu)條(tiao)件;GB/T 11158-2008 高(gao)溫(wen)試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱技(ji)術(shu)條(tiao)件;GB/T 10592 -2008 高(gao)低溫(wen)試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)箱技(ji)術(shu)條(tiao)件;GB/T 5170.1-2008 電(dian)(dian)(dian)(dian)(dian)工(gong)電(dian)(dian)(dian)(dian)(dian)子產(chan)品(pin)環境試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)設備(bei)檢驗(yan)(yan)(yan)(yan)(yan)方法 總則;GB/T5170.2-2008 電(dian)(dian)(dian)(dian)(dian)工(gong)電(dian)(dian)(dian)(dian)(dian)子產(chan)品(pin)環境試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)設備(bei)檢驗(yan)(yan)(yan)(yan)(yan)方法 溫(wen)度試(shi)(shi)(shi)驗(yan)(yan)(yan)(yan)(yan)設備(bei)。
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