簡要描(miao)述:高(gao)(gao)低(di)溫(wen)持(chi)久試(shi)(shi)(shi)驗(yan)(yan)機(ji)就是集高(gao)(gao)溫(wen)功能(neng)(neng)+低(di)溫(wen)功能(neng)(neng)于一(yi)個設備里的(de)機(ji)器。可以(yi)任意供顧客選(xuan)擇低(di)溫(wen)試(shi)(shi)(shi)驗(yan)(yan)、高(gao)(gao)溫(wen)試(shi)(shi)(shi)驗(yan)(yan)、高(gao)(gao)低(di)溫(wen)交變試(shi)(shi)(shi)驗(yan)(yan)、高(gao)(gao)低(di)溫(wen)循環試(shi)(shi)(shi)驗(yan)(yan)、高(gao)(gao)低(di)溫(wen)定值試(shi)(shi)(shi)驗(yan)(yan)、高(gao)(gao)低(di)溫(wen)可編程試(shi)(shi)(shi)驗(yan)(yan)等(deng)條件。本試(shi)(shi)(shi)驗(yan)(yan)箱適用于各種(zhong)工(gong)業電子(zi)(zi)電器通訊等(deng)產(chan)品的(de)成品、半成品或原材(cai)料、配件等(deng)做(zuo)模擬環境較(jiao)寬的(de)溫(wen)度控制試(shi)(shi)(shi)驗(yan)(yan)。按(an)電工(gong)電子(zi)(zi)產(chan)品環境試(shi)(shi)(shi)驗(yan)(yan),試(shi)(shi)(shi)驗(yan)(yan)B《GB2423.2》:高(gao)(gao)溫(wen)試(shi)(shi)(shi)驗(yan)(yan)方法及電工(gong)電子(zi)(zi)產(chan)品環境試(shi)(shi)(shi)驗(yan)(yan),試(shi)(shi)(shi)驗(yan)(yan)A《GB2
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